1.

What Is The Test Access Port?

Answer»

The Test Access PORT (TAP) is a definition of the INTERFACE that needs to be included in an IC to make it capable of being included in boundary-scan architecture.

The port has four or five single bit connections, as follows:

  • TCK (The Test Clock Input)
  • TMS (The Test MODE Select)
  • TDI (The Test Data Input)
  • TDO (The Test Data Output)

 It also has an optional SIGNAL:

  • TRST*(The Test RESET Signal)

The Test Access Port (TAP) is a definition of the interface that needs to be included in an IC to make it capable of being included in boundary-scan architecture.

The port has four or five single bit connections, as follows:

 It also has an optional signal:


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